Jacqueline Daley HBSC, MLT, CIC, CSPDS, FAPIC and Sylvie Dufrense, PH.D. discuss quality monitoring of instrument and device processing.
Jacqueline Daley HBSC, MLT, CIC, CSPDS, FAPIC and Sylvie Dufrense, PH.D. discuss quality monitoring of instrument and device processing.